How do you think the new GigE standards will influence the machine vision industry?
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By Keith Reid
Practically every core technology area from illumination to software is advancing dramatically today. However, some limitations are starting to arise. One area of concern is in large-format imaging, with the mating of larger area or linescan sensors to many conventional lenses and mounting options (within certain restrictive environments). This can result in a loss of image quality around the edges, which impacts a variety of applications.
From a dimensional standpoint, sensors larger than one inch can become an issue. From a pixel standpoint, problems begin to arise at 1k on very fast systems (lower f-numbers). However, in moderate-speed systems problems may not be noticeable until a 2-4k sensor is used. Operational factors include the chief ray angle, back focal distance and working distance.
Advanced Imaging organized an exploratory roundtable discussion in May to look into the issues associated with large-format imaging. This discussion builds on an initiative started in 2005 by Edmund Optics (Barrington, N.J.) at the 2005 Robots and Vision Show, and an editorial discussion with Schneider Optics Inc. (Hauppauge, N.Y.) where these concerns were emphasized.
Roundtable participants were picked to provide a reasonable representation of the technologies in question — optics, sensors and cameras. The goal was to have two companies represented from each area. However, one optics company had to withdraw at the last minute and could not be replaced in time. The participants were: