Advanced Imaging


Advanced Imaging Magazine

Updated: July 8th, 2008 05:26 PM CDT

Digital Imaging System For Wafer Navigation and Testing

Designed for Engineers Doing Process Development or Device Characterization and Modeling

The eVue digital imaging system enables productivity gains in semiconductor wafer navigation and testing. Designed for engineers doing process development or device characterization and modeling, it can save two to three hours a day that is currently wasted on inefficient semiconductor navigation and test data collection issues, the company says. eVue allows users to navigate, observe and measure leading-edge devices quickly and effectively. It combines new wafer probe navigation tools and advanced video processing with next-generation digital microscope technology developed by Umech Technologies (Watertown, MA). CASCADE MICROTECH. Beaverton, OR.

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