Advanced Imaging


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Updated: July 8th, 2008 05:26 PM CDT

FEI's Titan(TM) S/TEM Achieves Low kV Milestone

via PRNewswire

"We are proud to deliver to our customers our promise of the ultimate performance, stability and flexibility for a new era of ground breaking results. We have shown the world record performance at 300kV before, now we can add the milestone at 80kV," said Rob Fastenau, senior vice president for FEI's NanoResearch & Industry and NanoBiology market divisions. He added: "I am very pleased that the Titan 80-300 shows direct atomic resolution over the entire range of operating voltages. It will give us the opportunity to further accelerate our mission to remain the world leader in high-resolution imaging and analysis and an important enabler for the world's growing nanotechnology industry."

The milestone results were achieved on a Titan 80-300 equipped with an aberration corrector. The Titan is designed as a dedicated and upgradeable aberration-corrected system for ultimate performance and ultimate flexibility. The corrector, developed by CEOS GmbH in close collaboration with FEI Company, allows for significant resolution improvement and removal of artifacts that normally hamper direct interpretation of images. The new resolution achievement underscores the ultimate flexibility and stability of the Titan 80-300 system.

About FEI Company

FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the sub-Angstrom level and provide innovative solutions for customers working in NanoBiology, NanoResearch and NanoElectronics. With R&D centers in North America and Europe , and sales and service operations in more than 50 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of this century into reality. More information can be found on the FEI website at:


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