Advanced Imaging


Industry News

Updated: July 8th, 2008 05:26 PM CDT

FEI's Titan(TM) S/TEM Achieves Low kV Milestone

via PRNewswire

HILLSBORO, Ore, July 31 /PRNewswire-FirstCall/ -- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time ever, directly interpretable TEM images with atomic resolution better than 1.4 Angstrom were obtained at the very low operating voltage of 80kV.

The result was welcomed by some of the world's leading research centers as an important milestone in nano characterization as now even light element materials such as carbon nanotubes and graphene can be imaged artifact-free and with high contrast while having highest lateral resolution.

Direct atomic resolution at 80kV was obtained for various classes of materials: gold nanoparticles, silicon and single wall carbon nanotubes. The smallest atomic distance resolved was the well-known silicon dumbbell distanceof 1.36 Angstrom. These new findings will be presented in a scientific presentation at the Microscopy & Microanalysis 2006 conference being held this week in Chicago .

"I am pleased to see this proof of the stability of the Titan column at the low-voltage end of its range. This is good news for the TEAM project, which specifically demands unprecedented resolution over the whole operating range of 80 to 300kV to meet a spectrum of scientific challenges. I consider this a significant milestone for the TEAM/FEI collaboration," commented Ulrich Dahmen, TEAM Project Director from the National Center for Electron Microscopyin Berkeley, California.

"With their resolving power at an accelerating voltage of only 80 kV, the Titan instruments will allow us to get much deeper and more reliable insight in materials classes previously excluded from high-resolution analysis due to their beam-sensitivity. This will include nanomaterials composed of light elements in both hard and soft matter, which can now be investigated at an unprecedented contrast and spatial resolution," said Joachim Mayer from the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons at the Research Centre Juelich, Germany .

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